Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)

Scanning Electron Microscopy (SEM)

Energy Dispersive X-ray Spectroscopy (EDS)


Elemental Dot Mapping & Line Scanning

Quantitative Composition Analysis

METL’s SEM department is equipped with a Hitachi S2400 Scanning Electron Microscope and an Oxford Instruments Energy Dispersive Spectroscopy (EDS) system, providing high-magnification examination of components and materials, and qualitative analysis of their composition and deposition. Sample preparation is supported by the rest of the lab, allowing extraction of specimens from larger samples. The maximum final sample size which can be placed in the chamber of the SEM is approximately 4x4x2 inches. The stage travel (x-y traversing range) is 0.5 by 1.0 inch.

For more information, or if you have any questions, please contact us.

Standards & Specifications

And many more from aerospace primes and other organizations!