Scanning Electron Microscopy
with METL
METL’s SEM department is equipped with a Hitachi S2400 Scanning Electron Microscope and an Oxford Instruments Energy Dispersive Spectroscopy (EDS) system, providing high-magnification examination of components and materials, and qualitative analysis of their composition and deposition. Sample preparation is supported by the rest of the lab, allowing extraction of specimens from larger samples.
Scanning Electron Microscopy (SEM)
High magnification imaging with unparalleled resolution. Includes reliable 20-5000X imaging of metallic samples.
Scanning Electron Microscopy (SEM)
High magnification imaging with unparalleled resolution. Includes reliable 20-5000X imaging of metallic samples.
Energy Dispersive X-Ray Spectroscopy (EDS)
Includes semi-quantitative chemical analysis, and elemental dot-map imaging for material characterization purposes.
Energy Dispersive X-Ray Spectroscopy (EDS)
Includes semi-quantitative chemical analysis, and elemental dot-map imaging for material characterization purposes.
Fractography
METL can perform detailed microscopic fractography. Let us help you identify the failure mode with indicators that are invisible to the naked eye.
Fractography
METL can perform detailed microscopic fractography. Let us help you identify the failure mode with indicators that are invisible to the naked eye.
Corrosion/Erosion Investigation
With SEM/EDS, corrosion product can be identified to help narrow down it's source. Detailed imagining provides a glimpse into corrosion and erosion patterns to better understand how the material is being effected.
Corrosion/Erosion Investigation
With SEM/EDS, corrosion product can be identified to help narrow down it's source. Detailed imagining provides a glimpse into corrosion and erosion patterns to better understand how the material is being effected.
Elemental Dot Mapping
Using SEM/EDS, images can be overlaid with elemental data that illuminates concentrations of elements detected. This can help differentiate where contamination, anomalies, or other features are located.
Elemental Dot Mapping
Using SEM/EDS, images can be overlaid with elemental data that illuminates concentrations of elements detected. This can help differentiate where contamination, anomalies, or other features are located.
Line Scanning
Need help measuring a depth of diffusion? Line scanning can measure trace amounts of elements as they diffuse into a matrix. This allows for a quantifiable depth of diffusion to be measured.
Line Scanning
Need help measuring a depth of diffusion? Line scanning can measure trace amounts of elements as they diffuse into a matrix. This allows for a quantifiable depth of diffusion to be measured.
Quantitative Chemical Analysis
For parts that cannot be destroyed, we can use standardized methods for identifying material family without having to section or grind your sample.
Quantitative Chemical Analysis
For parts that cannot be destroyed, we can use standardized methods for identifying material family without having to section or grind your sample.
Why METL
We provide third-party testing to ensure viability and reliability
Affordable
As an independent laboratory we have the freedom to offer extremely competitive rates without compromising our integrity.
Trusted Knowledge
With Over 45 years of service to customers of many industries, you can trust that you are getting the highest quality results.
Fast Service
We work with your schedule. Need your results by a specific date? Let us know and we will do our best to accommodate your requirements.